| Code | Detection method | Application | Analysis material | Type | Non destructive |
|---|---|---|---|---|---|
| XRF-VF300 | XRF | plating measurement | metal plating | benchtop | yes |


According to DIN ISO 3497, DIN 50987, and ASTM B568
Used for RoHS analysis, electroplating/electrophoretic plating analysis
Minimum measurement area of 0.2mm² with micro-focus X-ray generator and advanced optical switching focusing system
Equipped with manual zoom technology, it allows for non-destructive testing of irregular components with depths from 0 to 30mm
Core EFP algorithm for simultaneous analysis of 23 plating layers, 24 elements
| Code | Detection method | Application | Analysis material | Type | Non destructive |
|---|---|---|---|---|---|
| XRF-VF300 | XRF | plating measurement | metal plating | benchtop | yes |
View the complete
product specifications



