Scanning Acoustic Microscope
Code: UFD-CY Series
Suitable for automatic scanning of inclusions, cracks, porosity, delamination and other defects in metal and composite parts
It supports a full range of imaging modes including A, B, C, D and X, presenting product details with high precision, with data marking and waveform comparison functions, it enables in-depth tracking and accurate analysis of defects
Based on the propagation time and attenuation degree of the wave, the morphology and defect distribution inside the detection object are quickly presented
The number and dimensions of trays are customizable, with built-in functions including automatic image segmentation, empty tray recognition and skipping, etc.
Multiple measurement modes, precise evaluation, supporting up to 9 manual measurement methods including point-to-point, parallel width, multi-segment, and more to meet diverse measurement needs
| Code | Frequency | Sampling frequency | Gain adjustment range | Gain adjustment step | Maximum repetition frequency | Workstation |
|---|---|---|---|---|---|---|
| UFD-CY310 | 1~150MHz | 2GS/s | -32~80dB | 0.01dB | 65kHz | single station |
| UFD-CY320 | 5~300MHz | 2GS/s | -32~80dB | 0.01dB | 65kHz | single station |
| UFD-CY330 | 5~500MHz | 2GS/s | -32~80dB | 0.01dB | 65kHz | single station |
| UFD-CY340 | 1~150MHz | 1GS/s/CH | -32~80dB | 0.01dB | 65kHz | dual station |
| UFD-CY350 | 5~300MHz | 1GS/s/CH | -32~80dB | 0.01dB | 65kHz | dual station |
| UFD-CY360 | 5~500MHz | 1GS/s/CH | -32~80dB | 0.01dB | 65kHz | dual station |
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product specifications
